The 14th International Conference on LEEM/PEEM

The 14th International Conference on LEEM/PEEM (LEEM/PEEM-14) will be held from October 5th to 9th, 2026, at the University of Tokyo (Hongo Campus) in Japan. Continuing a tradition that began in 1998, this biennial workshop serves as the premier global forum for scientists, instrument developers, and industry partners dedicated to Low-Energy Electron Microscopy (LEEM) and Photoemission Electron Microscopy (PEEM). Following the success of our previous meeting in Montréal, LEEM/PEEM-14 returns to Japan for the first time since the Himeji meeting in 2006.
The conference will cover a broad spectrum of cutting-edge research, including:
  - Surface and Thin Film Science
  - Advanced Microscopy Techniques
  - Interdisciplinary Applications
Attendees can expect a dynamic program featuring Distinguished Guest Lecturers at the forefront of the field, insightful Tutorial Sessions for newcomers and veterans alike, and extensive opportunities for networking through poster sessions and social events.
We invite you to join us in the heart of Tokyo to share your latest discoveries, explore emerging trends, and strengthen the international LEEM/PEEM community.